Impact of Aberration-Corrected Electron Microscopy on Advanced Materials ResearchWednesday (28.09.2016) 14:45 - 15:15 Part of:
The recent emergence of aberration-correction methods has pushed electron microscope resolving power to well beyond the 1-Å resolution barrier, generating much excitement and activity in the microscopy community and greatly impacting the exploration of many types of advanced materials. The unrivalled imaging (and spectroscopic) capabilities of aberration-corrected electron microscopes (ACEMs) have enabled enhanced insights to be gained into the local atomic structure and chemical bonding at heterostructured interfaces. After a short introduction and overview of ACEM, this talk will concentrate on recent investigations of semiconductor/semiconductor, oxide/oxide, and oxide/semiconductor interfaces. Ongoing issues, problems and prospects will also be briefly discussed.