In order to advance our understanding of macroscopic properties such as strength, ductility, resistivity, etc. a detailed characterization of the material microstructure at various length scales is detrimental. During the last decade new advanced methods have emerged that permit visualizing microstructural details with unsurpassed high resolution. Many of these techniques are complementary, either in terms of the sensitive length scale or in terms of the field-of-view. For instance, atom probe tomography and transmission electron microscopy may provide detailed atomic information on the nature of a precipitate, whereas small angle scattering techniques provide statistical relevant information on size distribution and density. This symposium primarily focuses on various state-of-the-art high-resolution microstructure characterization methods. It will provide a platform where different communities meet with the aim to (1) improve developing synergies and (2) highlight recent milestones in advanced characterization methods. We particularly encourage contributions where multiple techniques are combined.
Topics of interest include but are not limited to:
- 3D atom probe tomography
- In and ex situ characterization using scanning and transmission electron microscopy
- High-resolution x-ray diffraction methods, including in and ex situ powder diffraction, small angle scattering and 3 dimensional x-ray diffraction.
- Advanced x-ray imaging methods such as x-ray coherent diffraction imaging and ptychography.