MSE 2016 - Full Program

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Keynote Lecture

Impact of Aberration-Corrected Electron Microscopy on Advanced Materials Research

Wednesday (28.09.2016)
14:45 - 15:15
Part of:

The recent emergence of aberration-correction methods has pushed electron microscope resolving power to well beyond the 1-Å resolution barrier, generating much excitement and activity in the microscopy community and greatly impacting the exploration of many types of advanced materials. The unrivalled imaging (and spectroscopic) capabilities of aberration-corrected electron microscopes (ACEMs) have enabled enhanced insights to be gained into the local atomic structure and chemical bonding at heterostructured interfaces. After a short introduction and overview of ACEM, this talk will concentrate on recent investigations of semiconductor/semiconductor, oxide/oxide, and oxide/semiconductor interfaces. Ongoing issues, problems and prospects will also be briefly discussed.

Prof. David Smith
Arizona State University